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Osaka, Japan
4-6 year
17 Feb 2025
Requirement
English follows-
Define and implement AOI processes for defect assessment and detection on SAW wafer substrates and in-line processes.
Analytical and Problem solving,Aartificial intelligence,Machine learning techniques,Effective communication skills
Tokyo, Japan; Osaka, Japan
6-8 year
23 Jun 2024
Minimum qualifications:
Big Data Technology,C++,Database,DevOps,Google Cloud Platform (GCP),IaaS,Java Programming,Machine learning techniques,NoSQL,PaaS,Python Programming,SaaS,SQL
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